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  2007 fairchild semiconductor corporation fdfc3n108 rev c2 (w) fdfc3n108 n-channel 1.8v specified powertrench mosfet with schottky diode general description this n-channel 1.8v specified mosfet uses fairchild?s advanced low voltage powertrench process. it is combined with a low forward drop schottky that is isolat ed from the mosfet, providing a compact power solution for battery power management and dc/dc converter applications. applications battery management/charger application dc/dc conversion features 3 a, 20 v r ds(on) = 70 m w @ v gs = 4.5 v r ds(on) = 95 m w @ v gs = 2.5 v low gate charge high performance trench technology for extremely low r ds(on) d1 s2 g1 d2 s1 g2 supersot -6 tm pin 1 supersot ?-6 mosfet maximum ratings t a =25 o c unless otherwise noted symbol parameter ratings units v dss drain-source voltage 20 v v gss gate -source voltage 12 v i d drain current ? continuous (note 1a) 3 a ? pulsed 12 maximum power dissipation (note 1a) 0.96 w (note 1b) 0.9 0 p d (note 1c) 0.7 0 t j , t stg operating and storage junction temperature range ?55 to +150 c schottky diode maximum ratings v rrm repetitive peak reverse voltage 20 v i o average forward current 2.0 a thermal characteristics r qja thermal resistance, junction-to -ambient (note 1a) 130 r qjc thermal resistance, junction-to - case (note 1) 60 c/w package marking and ordering information device marking device reel size tape width quantity .108 fdfc3n108 7?? 8mm 3000 units tm may 2007 fdfc3n108 n-channel 1.8v specified powertrench ? mosfet with schottky diode 1 3 2 4 5 6 a s g c nc d
fdfc3n108 rev c2 (w) electrical characteristics t a = 25c unless otherwise noted symbol parameter test conditions min typ max units off characteristics bv dss drain?source breakdown voltage v gs = 0 v, i d = 250 m a 20 v dbvdss dt j breakdown voltage temperature coefficient i d = 250 m a, referenced to 25 c 12 mv/ c i dss zero gate voltage drain current v ds = 16 v, v gs = 0 v 1 m a i gss gate ?body leakage v gs = 12 v, v ds = 0 v 100 na on characteristics (note 2) v gs(th) gate threshold voltage v ds = v gs , i d = 250 m a 0. 5 0.9 1.5 v dvgs(th) dt j gate threshold voltage temperature coefficient i d = 250 m a, referenced to 25 c ?3 mv/ c r ds(on) static drain?source on?resistance v gs = 4.5 v, i d = 3 a v gs = 2.5 v , i d = 2 .5 a v gs = 4.5 v, i d = 3 a, t j =125c 56 73 78 70 95 106 mw i d(on) on?state drain current v gs = 4.5 v, v ds = 5 v 12 a g fs forward transconductance v ds = 5 v, i d = 3 a 10 s dynamic characteristics c iss input capacitance 355 pf c oss output capacitance 85 pf c rss reverse transfer capacitance v ds = 10 v, v gs = 0 v, f = 1.0 mhz 45 pf r g gate resistance v gs = 15 mv, f = 1.0 mhz 2.0 w switching characteristics (note 2) t d(on) turn?on delay time 6 12 ns t r turn?on rise time 7 14 ns t d(off) turn?off delay time 20 36 ns t f turn?off fall time v dd = 10 v, i d = 1 a, v gs = 4.5 v, r gen = 6 w 1 2 ns q g total gate charge 3.5 4.9 nc q gs gate ?source charge 0.7 nc q gd gate ?drain charge v ds = 10v, i d = 3 a, v gs = 4.5 v 1.0 nc drain? source diode characteristics and maximum ratings i s maximum continuous drain?source diode forward current 0.8 a v sd drain?source diode forward voltage v gs = 0 v, i s = 0.8 a (note 2) 1.2 v t rr diode reverse recovery time 12 ns q rr diode reverse recovery charge i f = 3 a, d if /d t = 100 a/s 3 nc schottky diode characteristic t j = 25 o c 250 m a i r reverse leakage v r = 20v t j = 100 o c 10 ma v f forward voltage i f = 1a 363 425 mv i f = 2a 449 550 fdfc3n108 n-channel 1.8v specified powertrench ? mosfet with schottky diode
fdfc3n108 rev c2 (w) electrical characteristics t a = 25c unless otherwise noted notes: 1. r qja is the sum of the junction- to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. r q jc is gu aranteed by design while r qca is determined by the user's board design. a) 130 c/w when mounted on a 0.125 in 2 pad of 2 oz. copper. b) 140 c/w when mounted on a .004 in 2 pad of 2 oz copper c) 180 c/w when mounted on a minimum pad. scale 1 : 1 on letter size paper 2. pulse test: pulse width < 300ms, duty cycle < 2.0% fdfc3n108 n-channel 1.8v specified powertrench ? mosfet with schottky diode
fdfc3n108 rev c2 (w) typical chara cteristics 0 1 2 3 4 5 6 0 0.5 1 1.5 v ds , drain-source voltage (v) i d , drain-source current (a) v gs = 4.5v 3.5v 2.5v 1.5v 3.0v 2.0v 0.8 1 1.2 1.4 1.6 1.8 0 1 2 3 4 5 6 i d , drain current (a) r ds(on) , normalized drain-source on-resistance v gs = 2.0v 3.5v 4.5 v 3.0v 2.5v 4.0 v figure 1. on -region characteristics. figure 2. on -resistance variation with drain current and gate voltage. 0.6 0.8 1 1.2 1.4 1.6 -50 -25 0 25 50 75 100 125 150 t j , junction temperature ( o c) r ds(on) , normalized drain-source on-resistance i d = 3.0a v gs = 4.5v 0.03 0.055 0.08 0.105 0.13 0.155 0.18 0 2 4 6 8 10 v gs , gate to source voltage (v) r ds(on) , on-resistance (ohm) i d = 1.5a t a = 125 o c t a = 25 o c figure 3. on -resistance variation with temperature. figure 4. on -resistance variation with gate-to-source voltage. 0 2 4 6 8 10 12 0.5 1 1.5 2 2.5 3 v gs , gate to source voltage (v) i d , drain current (a) t a = -55 o c 25 o c 125 o c v ds = 5v 0.0001 0.001 0.01 0.1 1 10 100 0 0.2 0.4 0.6 0.8 1 1.2 1.4 v sd , body diode forward voltage (v) i s , reverse drain current (a) t a = 125 o c 25 o c -55 o c v gs = 0v figure 5. transfer characteristics. figure 6. body diode forward voltage variation with source current and temperature. fdfc3n108 n-channel 1.8v specified powertrench ? mosfet with schottky diode
fdfc3n108 rev c2 (w) typical characteristics 0 1 2 3 4 5 0 1 2 3 4 5 q g , gate charge (nc) v gs , gate-source voltage (v) i d = 3.0a v ds = -5v -10v -15v 0 100 200 300 400 500 0 5 10 15 20 v ds , drain to source voltage (v) capacitance (pf) c iss c rss c oss f = 1mhz v gs = 0 v figure 7. gate charge characteristics. figure 8. capacitance characteristics. 0.001 0.01 0.1 1 10 100 0.1 1 10 100 v ds , drain-source voltage (v) i d , drain current (a) dc 1s 100ms 10ms 1ms 100 ms r ds(on) limit v gs = 4.5v single pulse r q ja = 180 o c/w t a = 25 o c 0 10 20 30 40 50 0.0001 0.001 0.01 0.1 1 10 100 single pulse time (sec) power (w) single pulse r qja =180 o c/w t a = 25 o c figure 9. schottky diode forward voltage. figure 10. schottky diode reverse current. 0.001 0.01 0.1 1 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000 t 1 , time (sec) r(t), normalized effective transient thermal resistance r q ja (t) = r(t) * r q ja r q ja = 180 c/w t j - t a = p * r q ja (t) duty cycle, d = t 1 / t 2 p(pk) t 1 t 2 single pulse 0.01 0.02 0.05 0.1 0.2 d = 0.5 figure 11. transient thermal response curve. thermal characterization performed using the conditions described in note 1b transient thermal response will change depending on the circuit board design. fdfc3n108 n-channel 1.8v specified powertrench ? mosfet with schottky diode
trademarks the following are registered and unregistered trademarks and servic e marks fairchild semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. disclaimer fairchild semiconductor reserves the right to make changes without further notice to any products herein to improve reliability, function, or design . fairchild does not assume any liability arising out of the application or use of any product or circuit described herein; neither does it convey any li cense under its patent rights, nor the rights of others. these specifications do not expand th e terms of fairchild?s worldwide terms and conditions, specifically the warranty therei n, which covers these products. life support policy fairchild?s products are not authorized for use as critical components in life support devices or systems without the express written approval of fairchild semiconductor corporation. as used herein: 1. life support devices or sy stems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with in structions for use provided in the labeling, can be reasonably expect ed to result in a significant injury of the user. 2. a critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms acex ? build it now? coreplus? crossvolt ? ctl? current transfer logic? ecospark ? fact quiet series? fact ? fast ? fastvcore? fps? frfet ? global power resource sm green fps ? green fps? e-series? gto ? i-lo ? intellimax? isoplanar? megabuck? microcoupler? micropak? motion-spm? optologic ? optoplanar ? pdp-spm? power220 ? power247 ? poweredge ? power-spm? powertrench ? programmable active droop? qfet ? qs? qt optoelectronics? quiet series? rapidconfigure? smart start? spm ? stealth? superfet? supersot?-3 supersot?-6 supersot?-8 syncfet? the power franchise ? ? tinyboost? tinybuck? tinylogic ? tinyopto? tinypower? tinypwm? tinywire? serdes? uhc ? unifet? vcx? datasheet identification product status definition advance information formative or in design this datasheet contains the de sign specifications for product development. specifications may change in any manner without notice. preliminary first production this datasheet contains prelimi nary data; supplementary data will be published at a later date. fairchild semiconductor reserves the right to make changes at any time without notice to improve design. no identification needed full production this datasheet contains final s pecifications. fairchild semiconductor reserves the right to make changes at any time without notice to improve design. obsolete not in production this datasheet contains specific ations on a product that has been discontinued by fairchild semicon ductor.the datasheet is printed for reference information only. tm ?2007 fairchild semiconductor corporation www.fairchildsemi.com rev. i28 tm


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